1-ID beamline is an insertion device beamline capable of delivering monochromatized high-energy x-rays above 42 keV, providing a unique combination of penetration power and high spatio-temporal resolution.

These characteristics are exploited with three primary techniques

(i) high-energy diffraction microscopy (HEDM), 

(ii) combined high-energy small- and wide-angle x-ray scattering (HE-SAXS/WAXS), and 

(iii) high-energy tomography.

HEDM reveals information on individual grains (size, shape, orientation, strain) within polycrystalline aggregates, while HE-SAXS/WAXS reveals similar grain-averaged information over a wide range of size scales (0.1-100 nm). Incident x-ray beams can be focused down to the micron-level, and 3-dimensional information can be achieved either in direct space, using a conical-slit system (~100 micron resolution), or through reconstruction algorithms. These techniques rely on area detectors for efficient data collection with temporal resolutions down to 10msec, and are often used with thermo-mechanical environments, to enable studies of ‘real materials in real conditions’.

High-energy tomography is often combined with the scattering techniques to obtain a multi-modal 3D picture of a material.

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