Sector 33: 33-ID-D,E

Introduction

The facility provides advanced x-ray scattering and diffraction techniques to a diverse scientific community and supports advanced materials research as well as condensed matter physics. Primary usage encompasses surface and interface science, diffuse x-ray scattering, and general scattering and diffraction applications. X-ray reflection interface microscopy (XRIM) is now open to general users.

Beamline contacts
Name Email Telephone
Zhan Zhang [email protected] 630.252.0863
Hawoong Hong [email protected] 630.252.0864
Jon Tischler [email protected] (630) 252-0861