Beamline Phone Number: (630) 252-1834 Posters on APS User Meetings Three Dimensional Deformation Microstructure Measurement Under Indents Using Submicron Resolution X-Ray Structural Microscopy (APS User Meeting 2005) W. Yang, B. C. Larson, G. M. Pharr, J. Z. Tischler, G. E. Ice, J. D. Budai, and W. Liu Nondispersive Hard X-ray K-B Focusing Below 100 nm (APS User Meeting 2005) Wenjun Liu, Gene E. Ice, Jonathan Z. Tischler, B. C. Larson, P. Zschack, A. Khounsary, C. Liu, L. Assoufid, R. Divan, and A. Macrander Microdiffraction Characterization of Multiscale Deformation Mechanisms in the Weld Joint of a Nickel-based Superalloy (APS User Meeting 2005) R.I. Barabash, O.M. Barabash, G.E. Ice. W. Liu Development of Submicron Resolution 2D and 3D X-Ray Structural Microscopy (APS User Meeting 2004) B. C. Larson, W. Yang, J. D. Budai, J. Z. Tischler, G. E. Ice, and W. Liu 3D X-ray Diffraction Microscopy of Grain Boundaries (APS User Meeting 2003) Wenjun Liu, Gene E. Ice, Wenge Yang, Jon Z. Tischler, and Bennett C. Larson X-ray Optics for Diffraction Microprobe (APS User Meeting 2002) Gene E. Ice, Bennett C. Larson, Wenjun Liu, Jon Z.Tischler, John D. Budai, and Wenge Yang
