X-ray Laue Diffraction Microscopy in 3D at 34-ID-E, APS - Instruments

Beamline Phone Number: (630) 252-1834

Beamline Control

Sector 33/34 SSM group wiki website APS HPC Grid Report Sector 33/34 Control System EPICS (Experimental Physics and Industrial Control System) Retrieve Data from APS Control System 34-ID Front-end RFBPM Signals Experimental Floor Vibration monitors

Experimental Setup

Sample Coordinates (using PerkinElmer detector system and Igor software) Hutch Scheme End near Focus Differential Aperture Sample Holder Block

Old Experimental Setup (before 2009)

Sample Coordinates (using RoperScientific CCD and IDL software for data taken before Jan 2009) Hutch Scheme End near Focus Differential Aperture

Beamline Equipment

PerkinElmer XRD 0820 AN PerkinElmer XRD 1629 AN Roper Scientific PI•SCX:4300 CCD (Manual) (Distortion Map) Joerger Scaler: Model VSC16 Au film stripes

 

05.25.2018